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  1. Jeremy Feldblyum, Ming Liu, David W. Gidley, and Adam Matzger, Reconciling the Discrepancies between Crystallographic Porosity and Guest Access as Exemplified by Zn-HKUST-1, Journal of the American Chemical Society 133, 18257 (2011).
  2. Emmanouil Glynos, Bradley Frieburg, Hyunjoon Oh, Ming Liu, David W. Gidley, and Peter Green, Role of Molecular Architecture on the Vitrification of Thin Polymer Systems, Physical Review Letters 106, 128301 (2011).
  3. S. Harton, S. Kumar, H. Yang, T. Koga, K. Hicks, H. Lee, J. Mijovic, M. Liu, R. Vallery, and D. Gidley, Immobilized Polymer Layers on Spherical Nanoparticles, Macromolecules 43, 3415 (2010).
  4. M. Liu, A. Wong-Foy, R. Vallery, W. Frieze, J. Schnobrich, D. Gidley, and A. Matzger, Evolution of Nanoscale Pore Structure in Coordination Polymers During Thermal and Chemical Exposure Revealed by Positron Annihilation, Advanced Materials 22, 1598 (2010).
  5. M. Liu, A Wong-Foy, R. Vallery, W. Frieze, J. Schnobrich, D. Gidley, and A. Matzger, Evolution of Nanoscale Pore Structure in Coordination Polymers During Thermal and Chemical Exposure Revealed by Positron Annihilation, Advanced Materials 22, 1598 (2010).
  6. Ming Liu, R. S. Vallery, D. W. Gidley, M. E. Launey, and J. J. Kruzic, Assessment of the Fatigue Transformation Zone in Bulk Metallic Glasses Using Positron Annihilation Spectroscopy, Journal of Applied Physics 105, 093501 (2009).
  7. R. C. McDonald, David W. Gidley, Tracy Sanderson, R. S. Vallery, Evidence for Depth-dependent Structural Changes in Freeze-thaw-cycled Dry Nafion Using Positron Annihilation Lifetime Spectroscopy, Journal of Membrane Science 332, 89 (2009).
  8. H. W. Ro, H-g Peng, K-i Nihara, H-J Lee, E. K. Lin, A. Karim, D. W. Gidley, H. Jinari, D. Y. Yoon, and C. L. Soles, Self-sealing of Nanoporous Low Dielectric Constant Patterns Fabricated by Nanoimprint Lithography, Advanced Materials 20, 1994 (2008).
  9. R. S. Vallery, M. Liu, D. W. Gidley, M. E. Launey, and J. J. Kruzic, Characterization of Fatigue-induced Free Volume Changes in a Bulk Metallic Glass using Positron Annihilation Spectroscopy, Applied Physics Letters 91, 261908 (2007).
  10. H. W. Ro, R. L. Jones, H-g Peng, D. R. Hines, H-J Lee, E. K. Lin, A. Karim, D. Y. Yoon, D. W. Gidley, and C. L. Soles, The Direct Patterning of Nanoporous Interlayer Dielectric Insulator Films by Nanoimprint Lithography, Advanced Materials 19, 2919 (2007).
  11. H.-G. Peng, D.-Z. Chi, W.-D. Wang, J.-H. Li, K.-Y. Zeng, R.S. Vallery, W.E. Frieze, M. Skalsey, D.W. Gidley, and A.F. Yee, Pore Sealing by NH3 Plasma Treatment of Porous Low Dielectric Constant Films, Journal of the Electochemical Society 154, G85 (2007).
  12. D.W. Gidley, H.-G. Peng, and R.S. Vallery, Positron Annihilation as a Method to Charaterize Porous Materials, Annu. Rev. Mater. 36, 49 (2006).
  13. J.H. Yim, Y.Y. Lyu, H.D. Jeong, S.A. Song, I.S. Hwang, H.L. Jingyu, S.K. Mah, S. Chang, J.G. Park, Y.F. Hu, J.N. Sun, and D.W. Gidley, The Preparation and Characterization of Small Mesopores in Siloxane-Based Materials that use Cyclodextrins as Templates, Adv. Funct. Mater. 13, 382 (2003).
  14. C.L. Soles, J.F. Douglas, W.L. Wu, H. Peng, and D.W. Gidley, A Broad Perspective of the Dynamics of Highly Confined Polymer Films, Materials Research Society Symposium Proceeding 710, DD3.7.1, (2002)
  15. J.N. Sun, Y.F. Hu, W.E. Frieze, and D.W. Gidley, Characterizing Porosity in Nanoporous Thin Films Using Positronium Lifetime Annihilation Spectroscopy, Radiation Physics and Chemistry 68, 345 (2003).
  16. S. Yang, P. Mirau, J.N. Sun, and D.W. Gidley, Characterization of Nanoporous Ultra Low-k Thin Films Templated by Copolymers with Different Architectures, Radiation Physics and Chemistry 68, 351 (2003).
  17. J.N. Sun, Y. Hu, W.E. Frieze, W. Chen, and D.W. Gidley, How Pore Size and Surface Roughness Affect Diffusion Barrier Continuity on Porous Low-k Films, Journal of the Electrochemical Society 150, F97 2003.
  18. D.W. Gidley, J.N. Sun, Y.F. Hu, W.E. Frieze, and S. Yang, Characterizing Porosity in Nanoporous Thin Films Using Positronium Annihilation Lifetime Spectroscopy, Invited paper to the Materials Research Society Spring Meeting (vol. 726, Q10.5), April 2002 in San Francisco.
  19. J.N. Sun, D.W. Gidley, Y. F. Hu, W. E. Frieze and E. T. Ryan, Depth-profiling plasma-induced densification of porous low-k thin films using positronium annihilation lifetime spectroscopy, Applied Physics Letter 81, 8, 1447 (2002). 
  20. S. Yang, P. A. Mirau, C. S. Pai, O. Nalamasu, E. Reichmanis, J. C. Pai, Y. S. Obeng, J. Seputro, E. K. Lin, H. J. Lee, J. N. Sun and D. W. Gidley, Nanoporous Ultralow Dielectric Constant Organosilicates Templated by Triblock Copolymers, Chemistry of Materials 14, 369 (2002).
  21. S. Lin, J. N. Sun, D. W. Gidley, J. T. Wetzel, K. A. Monnig, E. T. Ryan, S. Jang, D. Yu and M. S. Liang, Positron Annihilation Lifetime Spectroscopy Application in Metal Barrier Layer Integrity for Porous Low-K Materials, Materials Research Society Symposium Proceeding 686, A9.7, (2002).
  22. J. N. Sun, D. W. Gidley, T. L. Dull, W. E. Frieze, A. F. Yee, E. T. Ryan, S. Lin and J. Wetzel, Probing Diffusion Barrier Integrity on Porous Silica Low-K Thin Films Using Positronium Annihilation Lifetime Spectroscopy, Journal of Applied Physics 89, 5138  (2001).
  23. S. Yang, P. A. Mirau, C. S. Pai, O. Nalamasu, E. Reichmanis, E. K. Lin, H. J. Lee, D. W. Gidley and J. N. Sun, Molecular Templating of Nanoporous Ultralow Dielectric Constant (1.5) Organosilicates by Tailoring the Microphase Separation of Triblock Copolymer, Chemistry of Materials 13, 9, 2762 (2001).
  24. E. T. Ryan, J. Martin, K. Junker, J. Wetzel, D. W. Gidley and J. N. Sun, Effect of Material Properties on Integration Damage in Organosilicate Glass Films, The Journal of Materials Research 16, 12, 3335 (2001).
  25. D. W. Gidley, K. G. Lynn, M. P. Petkov, J. N. Sun, M. H. Weber, and A. F. Yee, Depth-Profiled Positron Annihilation Spectroscopy of thin Insulation Films, New Directions in Antimatter Chemistry and Physics, edited by D. M. Surko and F. A. Gianturco, 151 (2001).
  26. T. L. Dull, W. E. Frieze, D. W. Gidley, J. N. Sun and A. F. Yee, Determination of Pore Size in Mesoporous Thin Films from the Annihilation Lifetime of Positronium, The Journal of Physical Chemistry B 105, 20, 4657 (2001).
  27. D. W. Gidley, T. L. Dull, W. E. Frieze, J. N. Sun and A. F. Yee, Probing Pore Characteristics in Low-K Thin Films Using Positronium Annihilation Lifetime Spectroscopy, Materials Research Society Symposium Proceeding 612, D4.3.1 (2000).
  28. D. W. Gidley, T. L. Dull, W. E. Frieze, J. Sun, A. F. Yee, C. V. Nguyen, and D. Y. Yoon, Determination of Pore-Size Distribution in Low-Dielectric Thin Film, Applied Physics Letter 76, 10, 1282 (2000).
  29.  D. W. Gidley,  W. E. Frieze, T. L. Dull, A. F. Yee, E. T. Ryan and H. M. Ho, Positronium annihilation in mesoporous thin films, Physical Review B 60, 8, R5157 (1999) .
  30. G. B. DeMaggio, W. E. Frieze, M. Zhu, D. W. Gidley, H. A. Hristov, and A. F. Yee, Interface and Surface Effects on the Glass Transition in Thin Polystyrene Films, Phys. Rev. Lett. 78, 1524 (1997).
  31. L. Xie, G. B. DeMaggio, W. E. Frieze, J. Devries, D. W. Gidley,  H. A. Hristov, and A. F. Yee, Positronium Formation as a Probe of Polymer Surfaces and Thin Films, Phys. Rev. Lett. 74, 4947 (1995).