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Home | Porous Low-k Dielectrics Thin Films | PALS Tutorial | Service and Contacts | Publications | Facilities | Review of Porous Material Charaterization | |
Who we are... |
Under the direction of Professor David Gidley the Michigan NanoPos group studies nano-scale defects and open volumes in condensed matter using positron annihilation spectroscopies. Our facilities include a bulk-Positron Annihilation Lifetime Spectroscopy (PALS) system and several positron beams located in the Department of Physics. We can perform beam-based PALS and beam-based Doppler Broadening Spectroscopy (DBS). Beam-based PALS has proven to be a powerful technique for characterizing the pore structure in porous thin films, especially low-k (dielectric) films. Our variable energy positron beams can depth-profile thin films. For a review of the PALS technique in characterizing porous materials, please see this review paper. We welcome collaborative opportunities. |
What we do (follow links)... | Research funded by... |
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For further information please contact us at: Randall Physics Laboratory, 450 Church Street, Ann Arbor, MI 48109-1040 Email: gidley@umich.edu Phone: (734)763-3464 Fax: (734)764-5153 |